A general implementation of the spectral domain method, formulated for planar microstrip circuits of arbitrary metallization pattern, is presented. The inclusion of a priori knowledge about the edge and corner singularities in the set of basis functions results in a large decrease in the order of the problem to be solved. Libraries of basis functions allow the rapid rigorous analysis of realistically complex circuits. Calculated S-parameters are given for three microstrip lowpass filters and compared to results from both measurements and other techniques.
Sponsorship: The authors wish to thank Prof. J P McGeehan for provision of facilities at the Centre for Communications Research, SERC UK and Elettronica (UK) Ltd. for financial support and are grateful to Elettronica (UK) Ltd. for supplying the measured response of the multi-element filters.
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Name of Conference: IEEE MTT-S International Microwave Symposium
Venue of Conference: Atlanta, GA, USA
- spectral-domain analysis, microwave circuits