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A review of probabilistic techniques: towards developing a probabilistic lifetime methodology in the creep regime

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)333-341
Number of pages9
JournalMaterials at High Temperatures
Volume34
Issue number5-6
Early online date13 Sep 2017
DOIs
DateAccepted/In press - 23 Aug 2017
DateE-pub ahead of print - 13 Sep 2017
DatePublished (current) - 2 Nov 2017

Abstract

Lifetime assessment procedures for high temperature components incorporate conservatism to account for various uncertainties. These assessments are by nature deterministic, and do not provide advice on assessing their in-built conservatism. Building on conventional deterministic approaches for assessing plant components, this paper outlines the initial stages of developing a probabilistic methodology for high temperature assessments associated with creep and creep-fatigue. The principal aim is to identify the main sources of uncertainty through probabilistic analyses and suggest systematic approaches for estimating conservatism. Such a need is not currently addressed by conventional deterministic assessments. Selected probabilistic techniques are highlighted, and proposed as the building blocks of a prospective probabilistic creep methodology. These help build confidence in the underlying procedures, while guiding future work and areas of further investigation. A case-study is presented to demonstrate the utility of sensitivity analysis techniques in identifying and quantifying parameter uncertainties in the assessment results.

    Research areas

  • Creep, creep-fatigue, life assessment, crack initiation, probabilistic techniques

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  • Full-text PDF (accepted author manuscript)

    Rights statement: This is the author accepted manuscript (AAM). The final published version (version of record) is available online via Taylor & Francis at http://www.tandfonline.com/doi/full/10.1080/09603409.2017.1371933. Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 376 KB, PDF-document

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