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A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. / Hatano, Toshiaki; Zhang, Kaiqiang; Khan, Said; Nguyen Tien, Thang; Herrmann, Guido; Edwards, C; Burgess, Stuart; Miles, Mervyn.

2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE), 2016. p. 7384-7389 7526838 (Proceedings of the American Control Conference (ACC)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Hatano, T, Zhang, K, Khan, S, Nguyen Tien, T, Herrmann, G, Edwards, C, Burgess, S & Miles, M 2016, A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. in 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA., 7526838, Proceedings of the American Control Conference (ACC), Institute of Electrical and Electronics Engineers (IEEE), pp. 7384-7389, 2016 American Control Conference, ACC 2016, Boston, United States, 6/07/16. https://doi.org/10.1109/ACC.2016.7526838

APA

Hatano, T., Zhang, K., Khan, S., Nguyen Tien, T., Herrmann, G., Edwards, C., ... Miles, M. (2016). A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. In 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA (pp. 7384-7389). [7526838] (Proceedings of the American Control Conference (ACC)). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ACC.2016.7526838

Vancouver

Hatano T, Zhang K, Khan S, Nguyen Tien T, Herrmann G, Edwards C et al. A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. In 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE). 2016. p. 7384-7389. 7526838. (Proceedings of the American Control Conference (ACC)). https://doi.org/10.1109/ACC.2016.7526838

Author

Hatano, Toshiaki ; Zhang, Kaiqiang ; Khan, Said ; Nguyen Tien, Thang ; Herrmann, Guido ; Edwards, C ; Burgess, Stuart ; Miles, Mervyn. / A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode. 2016 American Control Conference (ACC 2016): Proceedings of a meeting held at July 6–8, Boston, MA, USA. Institute of Electrical and Electronics Engineers (IEEE), 2016. pp. 7384-7389 (Proceedings of the American Control Conference (ACC)).

Bibtex

@inproceedings{800f04a8665d41f188d9211dc7500572,
title = "A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode",
abstract = "This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.",
author = "Toshiaki Hatano and Kaiqiang Zhang and Said Khan and {Nguyen Tien}, Thang and Guido Herrmann and C Edwards and Stuart Burgess and Mervyn Miles",
year = "2016",
month = "10",
doi = "10.1109/ACC.2016.7526838",
language = "English",
isbn = "9781467386838",
series = "Proceedings of the American Control Conference (ACC)",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
pages = "7384--7389",
booktitle = "2016 American Control Conference (ACC 2016)",
address = "United States",

}

RIS - suitable for import to EndNote

TY - GEN

T1 - A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode

AU - Hatano, Toshiaki

AU - Zhang, Kaiqiang

AU - Khan, Said

AU - Nguyen Tien, Thang

AU - Herrmann, Guido

AU - Edwards, C

AU - Burgess, Stuart

AU - Miles, Mervyn

PY - 2016/10

Y1 - 2016/10

N2 - This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.

AB - This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the vertical direction by piezo-actuation and the cantilever tip is excited in the horizontal direction at the resonance frequency of the cantilever beam. Once the cantilever tip approaches and interacts with a thin ordered water-layer usually found on any specimen at ambient conditions, the cantilever excitation amplitude changes. The extent of the changes depends on the vertical distance from the specimen surface, i.e. the amplitude level allows the detection of the distance between the cantilever-tip and the sample-substrate. Applying this relative height characteristic, a controller has been designed and implemented. This is based on a specially introduced amplitude detection scheme, a subsequent frequency-response based system identification, and a resulting controller design. The practical issues in developing this detection and control system are discussed. Experimental results prove that the presented relative height control method for specimen tracking is feasible and reliable.

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UR - https://css.paperplaza.net/conferences/conferences/2016ACC/program/2016ACC_ContentListWeb_3.html#frc13_02

U2 - 10.1109/ACC.2016.7526838

DO - 10.1109/ACC.2016.7526838

M3 - Conference contribution

SN - 9781467386838

T3 - Proceedings of the American Control Conference (ACC)

SP - 7384

EP - 7389

BT - 2016 American Control Conference (ACC 2016)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -