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'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups

Research output: Contribution to journalArticle

Original languageEnglish
JournalMeasurement Science and Technology
DOIs
DateAccepted/In press - 1 Aug 2018
DatePublished (current) - 1 Aug 2018

Abstract

High-speed atomic force microscopy (HS-AFM) is a powerful emerging technique used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it enables a new generation of discoveries at the atomic scale. Here, we demonstrate the use of an optical pickup unit (OPU) typically found in PCs, Hi-Fis and games consoles worldwide, as a vertical detection system within in a HS-AFM operated in contact mode. The OPU displacement performance is compared to that of a commercially available laser Doppler vibrometer with ±15 pm resolution. Sub-nanometre sensitivity is achieved with an OPU, presented via the identification of two resonant modes of a cantilever stimulated by ambient thermal excitation. To demonstrate the large dynamic range of the sensor at fast scan-speeds, surface profiles with step heights in excess of 100 nm and surface textures less than 10 nm were collected using a custom OPU based HS-AFM. The high fidelity measurements are extended to visible length scales in short timescales by imaging areas of up to 200 µm2 area at a pixel rate of 2 megapixels/s, tip velocity of 10 mm/s and area rate of 25 µm2/s.

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  • Full-text PDF (accepted author manuscript)

    Rights statement: This is the accepted author manuscript (AAM). The final published version (version of record) is available online via IOP Science at https://doi.org/10.1088/1361-6501/aad771 . Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 1 MB, PDF document

    Licence: CC BY-NC-ND

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