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'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups

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'Hi-Fi AFM' : high-speed contact mode atomic force microscopy with optical pickups. / Russell-Pavier, Freddie; Picco, Loren; Payton, Oliver; Day, John; Shatil, Namid; Yacoot, Andrew.

In: Measurement Science and Technology, 01.08.2018.

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@article{8a3e7000c6a14532b370833204c8672e,
title = "'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups",
abstract = "High-speed atomic force microscopy (HS-AFM) is a powerful emerging technique used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it enables a new generation of discoveries at the atomic scale. Here, we demonstrate the use of an optical pickup unit (OPU) typically found in PCs, Hi-Fis and games consoles worldwide, as a vertical detection system within in a HS-AFM operated in contact mode. The OPU displacement performance is compared to that of a commercially available laser Doppler vibrometer with ±15 pm resolution. Sub-nanometre sensitivity is achieved with an OPU, presented via the identification of two resonant modes of a cantilever stimulated by ambient thermal excitation. To demonstrate the large dynamic range of the sensor at fast scan-speeds, surface profiles with step heights in excess of 100 nm and surface textures less than 10 nm were collected using a custom OPU based HS-AFM. The high fidelity measurements are extended to visible length scales in short timescales by imaging areas of up to 200 µm2 area at a pixel rate of 2 megapixels/s, tip velocity of 10 mm/s and area rate of 25 µm2/s.",
author = "Freddie Russell-Pavier and Loren Picco and Oliver Payton and John Day and Namid Shatil and Andrew Yacoot",
year = "2018",
month = "8",
day = "1",
doi = "10.1088/1361-6501/aad771",
language = "English",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing",

}

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TY - JOUR

T1 - 'Hi-Fi AFM'

T2 - high-speed contact mode atomic force microscopy with optical pickups

AU - Russell-Pavier, Freddie

AU - Picco, Loren

AU - Payton, Oliver

AU - Day, John

AU - Shatil, Namid

AU - Yacoot, Andrew

PY - 2018/8/1

Y1 - 2018/8/1

N2 - High-speed atomic force microscopy (HS-AFM) is a powerful emerging technique used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it enables a new generation of discoveries at the atomic scale. Here, we demonstrate the use of an optical pickup unit (OPU) typically found in PCs, Hi-Fis and games consoles worldwide, as a vertical detection system within in a HS-AFM operated in contact mode. The OPU displacement performance is compared to that of a commercially available laser Doppler vibrometer with ±15 pm resolution. Sub-nanometre sensitivity is achieved with an OPU, presented via the identification of two resonant modes of a cantilever stimulated by ambient thermal excitation. To demonstrate the large dynamic range of the sensor at fast scan-speeds, surface profiles with step heights in excess of 100 nm and surface textures less than 10 nm were collected using a custom OPU based HS-AFM. The high fidelity measurements are extended to visible length scales in short timescales by imaging areas of up to 200 µm2 area at a pixel rate of 2 megapixels/s, tip velocity of 10 mm/s and area rate of 25 µm2/s.

AB - High-speed atomic force microscopy (HS-AFM) is a powerful emerging technique used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it enables a new generation of discoveries at the atomic scale. Here, we demonstrate the use of an optical pickup unit (OPU) typically found in PCs, Hi-Fis and games consoles worldwide, as a vertical detection system within in a HS-AFM operated in contact mode. The OPU displacement performance is compared to that of a commercially available laser Doppler vibrometer with ±15 pm resolution. Sub-nanometre sensitivity is achieved with an OPU, presented via the identification of two resonant modes of a cantilever stimulated by ambient thermal excitation. To demonstrate the large dynamic range of the sensor at fast scan-speeds, surface profiles with step heights in excess of 100 nm and surface textures less than 10 nm were collected using a custom OPU based HS-AFM. The high fidelity measurements are extended to visible length scales in short timescales by imaging areas of up to 200 µm2 area at a pixel rate of 2 megapixels/s, tip velocity of 10 mm/s and area rate of 25 µm2/s.

U2 - 10.1088/1361-6501/aad771

DO - 10.1088/1361-6501/aad771

M3 - Article

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

ER -