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Investigating the diagnostic capabilities of monitored system parameters to support improvements in conveyor operation and maintenance

Research output: Contribution to conferencePaper

Original languageEnglish
Number of pages34
DateAccepted/In press - 7 Apr 2017
DatePublished (current) - 16 Jun 2017
EventFirst World Congress on Condition Monitoring - ILEC conference centre, London, United Kingdom
Duration: 13 Jun 201716 Jun 2017


ConferenceFirst World Congress on Condition Monitoring
Abbreviated titleWCCM2017
CountryUnited Kingdom
Internet address


This paper investigates the potential value of a range of system parameters in supporting improvements in operation and maintenance practices of conveyor systems. To achieve this a conveyor emulation rig (CER) is developed to emulate the dynamics of a typical industrial conveyor system and allow the controlled application of a range of loading conditions and fault scenarios typical of general processing industries.

Initially, the design and specification of the rig is discussed, after which data is presented and analysed in the context of characterising the operational envelope of the system as well as supporting fault detection, isolation and typing tasks. For the purpose of this paper, the operational conditions employed to characterise the system include variations of radial, axial and braking loads, and types of seeded fault include component damage and environmental changes.
Results suggest that individual parameters present sensitivity to only a specific subset of scenarios and, as such, a greater fidelity of inference can potentially be achieved when the data from a range of parameters is considered in conjunction as opposed to each in isolation.

    Research areas

  • Condition monitoring, Maintenance, Sensors, Conveyor systems


First World Congress on Condition Monitoring

Abbreviated titleWCCM2017
Duration13 Jun 201716 Jun 2017
Location of eventILEC conference centre
CountryUnited Kingdom
Web address (URL)
Degree of recognitionInternational event

Event: Conference

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    Rights statement: This is the author accepted manuscript (AAM). Please refer to any applicable terms of use of the publisher BINDT.

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