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RGBD Relocalisation Using Pairwise Geometry and Concise Key Point Sets

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2015 IEEE International Conference on Robotics and Automation (ICRA 2015)
Subtitle of host publicationProceedings of a meeting held 26-30 May 2015, Seattle, Washington, US
Publisher or commissioning bodyInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages6
ISBN (Electronic)9781479969234
ISBN (Print)9781479969241
DateAccepted/In press - 30 Jan 2015
DateE-pub ahead of print - 26 May 2015
DatePublished (current) - Aug 2015
Event2015 IEEE International Conference on Robotics and Automation - Washington, Seattle, United States
Duration: 26 May 201530 May 2015

Publication series

NameProceedings of the IEEE International Conference on Robotics and Automation (ICRA)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISSN (Print)1050-4729


Conference2015 IEEE International Conference on Robotics and Automation
CountryUnited States


We describe a novel RGBD relocalisation algorithm based on key point matching. It combines two com- ponents. First, a graph matching algorithm which takes into account the pairwise 3-D geometry amongst the key points, giving robust relocalisation. Second, a point selection process which provides an even distribution of the ‘most matchable’ points across the scene based on non-maximum suppression within voxels of a volumetric grid. This ensures a bounded set of matchable key points which enables tractable and scalable graph matching at frame rate. We present evaluations using a public dataset and our own more difficult dataset containing large pose changes, fast motion and non-stationary objects. It is shown that the method significantly out performs state-of-the-art methods.

    Research areas

  • computer vision, robotics, SLAM, delocalisation


2015 IEEE International Conference on Robotics and Automation

Duration26 May 201530 May 2015
Location of eventWashington
CountryUnited States
Degree of recognitionInternational event

Event: Conference

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  • Full-text PDF (accepted author manuscript)

    Rights statement: This is the author accepted manuscript (AAM). The final published version (version of record) is available online via IEEE at Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 2 MB, PDF-document


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